Sem

SEM is indispensable in semiconductor failure analysis, providing high-resolution imaging, elemental analysis, and cross-sectional insights crucial for identifying and mitigating device failure modes.

The FIB-SEM system integrates ion beam and electron microscopy functions, allowing for microscopic imaging and analysis in multiple scientific disciplines. This article provides a detailed introduction to the principles and main application areas of FIB-SEM.

This article mainly introduces the requirements for preparing SEM standard samples.

This article mainly introduces the applications of scanning electron microscopy (SEM) in various fields along with case studies.

Scanning Electron Microscopy (SEM) finds extensive applications in fields such as materials science, physics, chemistry, geology, and the microelectronics industry. It is an indispensable analytical tool in research. This article provides a detailed introduction to the principles, equipment, advantages, and disadvantages of SEM.

This paper introduces the technological development of EBSD this year and some of its applications in various fields of science and technology.