Sims

D-SIMS uses high-energy ion bombardment to generate secondary ions, offering high resolution and sensitivity in analyzing sample surface chemical composition and structure.

SEM and TEM are key for characterizing materials, revealing the "structure-composition-performance" relationship, with SEM focusing on surface morphology and composition.

TEM/STEM are essential for nanostructure characterization, offering diverse imaging modes and highly sensitive details on elemental composition and electronic structure.

Time of Flight Secondary Ion Mass Spectrometry (TOF-SIMS) is a highly sensitive surface analysis technology ...