Spectrometry

Liquid Mass Spectrometers (LC/MS or LC/MS/MS) use different ionization methods including Atmospheric Pressure Ion Sources (API), Matrix Assisted Laser-Defined Ionization Sources (MALDI), and Fast Atom Bombardment Sources (FAB) for different types of sample analysis.

D-SIMS uses high-energy ion bombardment to generate secondary ions, offering high resolution and sensitivity in analyzing sample surface chemical composition and structure.

SEM and TEM are key for characterizing materials, revealing the "structure-composition-performance" relationship, with SEM focusing on surface morphology and composition.

Almost all infrared spectrometers today are of the Fourier transform type.

Time of Flight Secondary Ion Mass Spectrometry (TOF-SIMS) is a highly sensitive surface analysis technology ...