Txrf

This article explores the key benefits of TXRF, including its high sensitivity, non-destructive nature, and reduced background noise, making it an ideal choice for trace element analysis in semiconductor manufacturing.

Total Reflection X-ray Fluorescence (TXRF) is a recent multi-element analysis technique with low detection limits, minimal sample requirements, high accuracy, simplicity, speed, and non-destructive capabilities. It is an irreplaceable and competitive method, leading in atomic spectrometry.