Wishing You a Happy New Year!

Universallab has recently taken a strategic leap by relocating to a new address adjacent to Park Innovaare. This move unveils a host of advantages that position Universallab at the forefront of innovation and excellence.

UnversalLab, headquartered in the Swiss Innovation Park, stands as a pioneering force in providing cutting-edge non-standard scientific analysis and testing services globally.

In the year 2024, UniversalLab embarks on a new journey, officially welcoming a transformative moment by relocating its headquarters to Park Innovaare Parkstrasse 1.

The atomic force microscopy (AFM) probe can be used for specific lithography tasks and retracted to inspect the completed work. However, this approach wears down the probe tip, thereby affecting measurement quality.

Surface light scattering technology analyzes light wave scattering characteristics to measure surface roughness, thin film thickness, and defect distribution. With advancements in laser sources, detection systems, and data processing, this technique has significantly evolved in precision manufacturing, semiconductor inspection, and biomedical applications. This paper reviews its principles, instrument development, and applications while exploring future trends such as intelligent analysis and high-resolution measurements.

Fine particles smaller than 63 μm were analyzed using a Laser Granulometer (LG) and an X-ray Sedigraph (XS) to compare the data and highlight potential differences.

In this study, the LISST was post-cruise calibrated by the manufacturer using NIST-traceable submicron beads, where it was determined that adjustments should be made to the dcal values of the two outer detector rings.