All articles

The article discusses nanomedicines and their characterization methods. It outlines two main categories brand new nanomedicines (directly processed from raw drugs) and nanocarriers (systems like nanoliposomes and polymer micelles that carry traditional drugs). While nanomedicines offer advantages over traditional drugs, they face stability and absorption challenges. Small-angle X-ray scattering (SAXS) is presented as a key analytical method for characterizing nanoparticles, capable of measuring particles between 1-300 nm, though it has limitations with microporous and mixed-composition materials.

This paper focuses on the process of XRD physical phase analysis.

This paper focuses on the Scherrer formula for calculating grain size.

This article introduces the history of TEM, its equipment structure, and sample preparation methods.

This article covers the principles of TEM testing and common sample preparation challenges. It discusses electron beam interactions, imaging mechanisms, and issues like particle agglomeration, dispersion techniques, and cooling for electrolytic thinning. Special considerations for biological samples, including dehydration and staining, are also addressed, with practical solutions provided.

This article introduces the differences between monocrystalline silicon, polycrystalline silicon, and amorphous silicon, focusing on their applications in semiconductors and photovoltaics. It details two major monocrystalline silicon manufacturing methods:the Czochralski (CZ) method and the Floating Zone (FZ) method, analyzing their processes, conductivity determination, and advantages/disadvantages.

This article focuses on some XRD issues regarding diffractogram data collection.

This article summarizes XRD issues on X ray small angle diffraction, small angle scattering, and on powder diffraction databases

This article focuses on some of the problems associated with XRD physical phase analysis.

This article focuses on some XRD issues regarding diffractogram data collection.

Electromagnetic waves in waveguides are classified into TE, TM, and TEM modes. TE modes have magnetic components, TM modes have electric components, and TEM modes have neither in the propagation direction. These modes determine the field distribution in transmission lines or cavities. Waveguides can support single-mode or multi-mode transmission depending on their dimensions and cutoff frequencies.

The principle of calibration for electron diffraction patterns in TEM involves adjusting diffraction patterns to known standards. This ensures accurate measurements of interplanar spacing, crystal orientation, and lattice constants, helping determine the material's atomic structure.