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X-ray diffraction (XRD) stands as one of the most powerful analytical techniques in materials science today. This non-destructive method provides researchers with crucial insights into crystalline materials across diverse fields including metallurgy, pharmaceuticals, semiconductors, ceramics, and geological sciences. While the theoretical foundations of XRD are well-established, its practical applications continue to expand as technology advances. This blog explores how XRD serves as an indispensable tool for determining crystallinity and orientation in modern materials research and industrial applications.

The atomic force microscopy (AFM) probe can be used for specific lithography tasks and retracted to inspect the completed work. However, this approach wears down the probe tip, thereby affecting measurement quality.

Surface light scattering technology analyzes light wave scattering characteristics to measure surface roughness, thin film thickness, and defect distribution. With advancements in laser sources, detection systems, and data processing, this technique has significantly evolved in precision manufacturing, semiconductor inspection, and biomedical applications. This paper reviews its principles, instrument development, and applications while exploring future trends such as intelligent analysis and high-resolution measurements.

Intercalation materials represent a fascinating class of compounds that have gained significant attention in various fields, particularly in energy storage technologies. X-ray diffraction (XRD) serves as a powerful analytical technique for characterizing these materials, providing crucial insights into their structural properties. This blog explores how XRD can be used to track and interpret changes in diffraction angles and interlayer spacing during the intercalation process.

UniversalLab, a Swiss materials characterization laboratory, made significant contributions to breakthrough metallurgical research at KTH Royal Institute of Technology through advanced X-ray diffraction analysis of interactions between liquid iron and refractory oxides, with important implications for improving steel production processes.

Fine particles smaller than 63 μm were analyzed using a Laser Granulometer (LG) and an X-ray Sedigraph (XS) to compare the data and highlight potential differences.

In this study, the LISST was post-cruise calibrated by the manufacturer using NIST-traceable submicron beads, where it was determined that adjustments should be made to the dcal values of the two outer detector rings.

X-ray diffraction (XRD) has emerged as one of the most powerful analytical techniques for the characterization of diamond materials. As a non-destructive method that reveals detailed information about the crystallographic structure, chemical composition, and physical properties of materials, XRD plays a crucial role in both fundamental diamond research and industrial applications. This blog explores the various applications of XRD in diamond analysis, highlighting its importance in quality assessment, defect identification, and the development of novel diamond-based technologies.

X-Ray Diffraction (XRD) is an indispensable analytical technique in materials science that helps researchers identify crystal structures, phase compositions, lattice parameters, and other crucial information about materials. This article delves into the fundamental principles of XRD and practical techniques for its application, helping researchers better utilize this powerful tool.

The article provides a detailed technical explanation of Inductively Coupled Plasma Mass Spectrometry (ICP-MS), covering its principles, components, operation process, potential interferences, and common troubleshooting issues when analyzing elemental composition of samples.

The article provides an overview of the working principles and applications of Inductively Coupled Plasma Mass Spectrometry (ICP-MS), including plasma generation methods, mass spectrometry analysis principles, and its applications in analyzing metal impurities, trace elements in mining samples, and trace heavy metal elements in biochemical samples.

Ultraviolet Photoelectron Spectroscopy (UPS) and X-ray Photoelectron Spectroscopy (XPS) measurements were conducted on freshly cleaved HOPG in ultrahigh vacuum and after exposure to ambient air.