All articles

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In this article, we introduce the density of states (DOS) analysis, an electronic structure analysis method that is closely related to band structure analysis.

Mass spectrometers, as crucial instruments in the field of analytical science, have a long-standing history and continue to evolve through ongoing innovation. Since the advent of the parabolic spectrograph in 1912 (detailed in the appendix), mass spectrometry has been widely applied across numerous fields, including physics, analytical chemistry, and forensic science. This article aims to provide readers new to mass spectrometry with a comprehensive and in-depth understanding of the instrument's components, working principles, and key ion source technologies, enabling a better appreciation of this powerful analytical tool.

Nanoindentation is a high-precision, non-destructive mechanical testing technique that uses depth-sensing indentation and advanced computational models to determine a material’s hardness and elastic modulus, with wide applications in microelectronics, biomedicine, advanced materials, and coatings, and is evolving toward higher resolution and multifunctional integration.

We discuss charge density difference and charge population analysis together because they both focus on similar aspects—understanding electron transfer during chemical processes. In this article, we will explore these two methods in terms of their principles, calculation procedures, and practical applications.

The N orbital energy states were obtained and correlated with the atomic chemical states of amines through their formation energies.

An arched specimen with an artificial notch introduced at the bending edge enables effective observation of damage evolution and crack propagation during the brittle fracture of shale.

In the field of analytical chemistry, inductively coupled plasma (ICP) technology is widely used in elemental analysis due to its characteristics such as high sensitivity, low detection limit and wide linear dynamic range. ICP-OES (Inductively Coupled Plasma Optical Emission Spectrometry) and ICP-MS (Inductively Coupled Plasma Mass Spectrometry) are two analytical instruments based on ICP technology, and they each have their own characteristics and advantages in elemental analysis.

The focused ion beam (FIB) system is a multifunctional tool primarily used for imaging, sputtering, and deposition applications. This article discusses the extensive applications of FIB in transmission electron microscope sample preparation, cross-section cutting analysis, chip repair, and highlights its significance in micro-nano structure fabrication and three-dimensional reconstruction analysis.

The transmission electron microscope (TEM) is a crucial tool in electron microscopy, primarily used for imaging and structural analysis of samples. This article introduces the sample preparation methods for TEM, emphasizing the impact of sample characteristics on test results and comparing various sample preparation techniques.

X-ray photoelectron spectroscopy (XPS) is a non-destructive technique that analyzes material surfaces at depths of 3 to 10 nm using a photon beam. It preserves structural information and enables qualitative and quantitative analysis of elemental composition, chemical valence states, and bonds. Angular resolution XPS (ARXPS) can assess ultra-thin layers, and combined with argon ion etching, it extends analysis beyond 10 nm.XPS is widely applied in elemental analysis, multiphase research, and structure analysis, particularly in catalysis, metal corrosion, adhesion, batteries, and semiconductors. This paper covers the principles and applications of XPS in materials science, along with common challenges and solutions.

The GLACIATION event in Zurich highlighted Europe's pursuit of digital sovereignty by harmonizing privacy, sustainability, and innovation, with Universallab's AI-driven material science playing a pivotal role.