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The GLACIATION event in Zurich highlighted Europe's pursuit of digital sovereignty by harmonizing privacy, sustainability, and innovation, with Universallab's AI-driven material science playing a pivotal role.

One of the initial attempts to measure this was using Atomic Force Microscopy (AFM) in a Wilhelmy-like experiment.

The Atomic Force Microscope (AFM) probe can be used for specific lithography tasks and can be retracted to detect the work done; however, this practice reduces the probe tip, which in turn affects the measurement quality.

An important aspect of any crime scene investigation is the detection, preservation, and analysis of trace evidence, and the forensic potential of the Atomic Force Microscope (AFM).

Three months ago, UniversalLab/SciRep/UniversalLab AI was honored to receive 🎉 CHF 10,000 in support from Venture Kick and its esteemed investor jury.

X-ray diffraction (XRD) stands as one of the most powerful analytical techniques in materials science today. This non-destructive method provides researchers with crucial insights into crystalline materials across diverse fields including metallurgy, pharmaceuticals, semiconductors, ceramics, and geological sciences. While the theoretical foundations of XRD are well-established, its practical applications continue to expand as technology advances. This blog explores how XRD serves as an indispensable tool for determining crystallinity and orientation in modern materials research and industrial applications.

The atomic force microscopy (AFM) probe can be used for specific lithography tasks and retracted to inspect the completed work. However, this approach wears down the probe tip, thereby affecting measurement quality.

Surface light scattering technology analyzes light wave scattering characteristics to measure surface roughness, thin film thickness, and defect distribution. With advancements in laser sources, detection systems, and data processing, this technique has significantly evolved in precision manufacturing, semiconductor inspection, and biomedical applications. This paper reviews its principles, instrument development, and applications while exploring future trends such as intelligent analysis and high-resolution measurements.

Intercalation materials represent a fascinating class of compounds that have gained significant attention in various fields, particularly in energy storage technologies. X-ray diffraction (XRD) serves as a powerful analytical technique for characterizing these materials, providing crucial insights into their structural properties. This blog explores how XRD can be used to track and interpret changes in diffraction angles and interlayer spacing during the intercalation process.

UniversalLab, a Swiss materials characterization laboratory, made significant contributions to breakthrough metallurgical research at KTH Royal Institute of Technology through advanced X-ray diffraction analysis of interactions between liquid iron and refractory oxides, with important implications for improving steel production processes.

Fine particles smaller than 63 μm were analyzed using a Laser Granulometer (LG) and an X-ray Sedigraph (XS) to compare the data and highlight potential differences.

In this study, the LISST was post-cruise calibrated by the manufacturer using NIST-traceable submicron beads, where it was determined that adjustments should be made to the dcal values of the two outer detector rings.