Afm

One of the initial attempts to measure this was using Atomic Force Microscopy (AFM) in a Wilhelmy-like experiment.

The Atomic Force Microscope (AFM) probe can be used for specific lithography tasks and can be retracted to detect the work done; however, this practice reduces the probe tip, which in turn affects the measurement quality.

An important aspect of any crime scene investigation is the detection, preservation, and analysis of trace evidence, and the forensic potential of the Atomic Force Microscope (AFM).

The atomic force microscopy (AFM) probe can be used for specific lithography tasks and retracted to inspect the completed work. However, this approach wears down the probe tip, thereby affecting measurement quality.

AFM IR is a family of techniques based on detecting mechanical response of the AFM cantilever upon pulsed illumination of sample with IR light. AFM IR family includes Tapping and Surface Sensitive AFM IR, Photoinduced Force Microscopy and Photothermal Expansion Microscopy, primarily utilized for sample absorption mapping and spectroscopy of materials with relatively large absorption coefficient.

Atomic force microscopy (AFM) is a powerful scientific tool that can be used to study a wide range of parameters such as nanoparticle size, surface roughness, and thickness of materials at high resolution.