Afm

The atomic force microscopy (AFM) probe can be used for specific lithography tasks and retracted to inspect the completed work. However, this approach wears down the probe tip, thereby affecting measurement quality.

AFM IR is a family of techniques based on detecting mechanical response of the AFM cantilever upon pulsed illumination of sample with IR light. AFM IR family includes Tapping and Surface Sensitive AFM IR, Photoinduced Force Microscopy and Photothermal Expansion Microscopy, primarily utilized for sample absorption mapping and spectroscopy of materials with relatively large absorption coefficient.

Atomic force microscopy (AFM) is a powerful scientific tool that can be used to study a wide range of parameters such as nanoparticle size, surface roughness, and thickness of materials at high resolution.