Ir

AFM IR is a family of techniques based on detecting mechanical response of the AFM cantilever upon pulsed illumination of sample with IR light. AFM IR family includes Tapping and Surface Sensitive AFM IR, Photoinduced Force Microscopy and Photothermal Expansion Microscopy, primarily utilized for sample absorption mapping and spectroscopy of materials with relatively large absorption coefficient.

This paper focuses on the application of infrared spectroscopy coupling techniques in the study of thermal decomposition of materials

This article provides a detailed explanation of the basic principles of infrared (IR) spectroscopy, with a particular focus on key concepts regarding FT-IR, ATR, transmission, and reflection.