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The article summarizes some common questions about TEM and provides answers for everyone.

The high efficiency sputtering of FIB enables fine processing of samples, so FIB is often used to optimise the preparation of ultra-thin samples for TEM.

In this article, we will introduce and compare various commonly used sample preparation methods in transmission electron microscopy.

In this article, we will introduce and compare various commonly used sample preparation methods in transmission electron microscopy.

In situ electron microscopy research is in full swing and has yielded many impressive results.

Digital Micrograph is a professional software for processing images taken by transmission electron microscopy (TEM). It helps researchers to measure and analyse the microstructure of materials, such as measuring the distance between atoms and analysing the crystal structure of materials.

Focused Ion Beam (FIB) technology is similar to a miniature, high-precision "sculpting tool" for materials, and is widely used in areas such as the fabrication of microscopic electronic devices.

In situ TEM is crucial for understanding complex battery reactions in energy storage, overcoming traditional method limitations with high-resolution and dynamic observation.