Wiki
Application of Photomask Imaging Detection Technology in the Semiconductor Industry
This article primarily discusses the application of photolithography mask imaging inspection technology in the semiconductor industry.
Learn more →Monochrome Micro X-ray Fluorescence
This article is about monochromatic micro X-ray fluorescence.
Learn more →Non-Destructive Testing Technology Based on Hyperspectral Imaging
This article mainly introduces the advantages of hyperspectral imaging, which combines image technology and spectral technology.
Learn more →How to Test the Conductivity of Composite Materials?
This article provides a comprehensive guide on testing the conductivity of composite materials, covering both electrical and thermal conductivity. It includes various methods, tools, and best practices to ensure accurate measurements.
Learn more →Understanding Contact Angle and Its Applications in Material Science
This article provides a brief example of the application of contact angle testing in the field of materials.
Learn more →Understanding Contact Angle and Its Applications in Material Science
The concept of contact angle is fundamental in material science, serving as a measure of the wettability of a solid by a liquid. This angle, formed at the interface between a liquid droplet and a solid surface, provides critical insights into the interaction between the two phases. The contact angle is influenced by the intermolecular forces between the liquid, solid, and surrounding medium, making it a vital parameter in various scientific and industrial applications.
Learn more →Applications of SEM in Semiconductor Device Failure Analysis
SEM is indispensable in semiconductor failure analysis, providing high-resolution imaging, elemental analysis, and cross-sectional insights crucial for identifying and mitigating device failure modes.
Learn more →Summary of Semiconductor Material Testing Methods
Semiconductor material testing methods include SEM, optical microscopy, XRD, Raman spectroscopy, and electrical tests like Hall effect and conductivity. These techniques evaluate surface structures, crystal composition, and electrical properties, optimizing materials for electronic devices.
Learn more →The Application of DSC in the Area of Oxides Layer Analysis of Materials
Differential Scanning Calorimetry (DSC) is a powerful analytical technique widely used in the study of material properties, including the analysis of oxide layers. This blog will explore the various applications of DSC in oxide layer analysis, highlighting its significance and utility in different fields.
Learn more →What are the differences between Scan and BIST in chip design and testing?
Scan and Built-In Self-Test (BIST) are chip testing methods. Scan testing adds circuitry for external fault detection, while BIST integrates self-testing mechanisms, allowing autonomous testing. Scan relies on external equipment; BIST enhances reliability with on-demand self-testing. Both improve fault detection but differ in implementation.
Learn more →Advantages of TXRF in Semiconductor Testing
This article explores the key benefits of TXRF, including its high sensitivity, non-destructive nature, and reduced background noise, making it an ideal choice for trace element analysis in semiconductor manufacturing.
Learn more →Advantages of XRTF over traditional semiconductor testing
This article mainly introduces the application fields and advantages of TXRF.
Learn more →Comparing XRF and Traditional Semiconductor Testing Methods
This article provides a detailed comparison between X-Ray Fluorescence (XRF) and traditional semiconductor testing methods, highlighting their principles, applications, advantages, and limitations.
Learn more →Exploring the Applications of Total Reflection X-ray Fluorescence (TXRF)
This method is widely recognized for its high sensitivity, low background noise, and non-destructive nature, making it invaluable in various fields such as semiconductor metrology, pharmaceuticals, and environmental science.
Learn more →Summary of Methods for Testing the Thermodynamic Properties of Materials
This article provides a detailed overview of various methods used to test the thermodynamic properties of materials, including Differential Scanning Calorimetry (DSC), Thermogravimetric Analysis (TGA), and X-ray Absorption Spectroscopy (XAS). These techniques are essential for understanding the thermal behavior, stability, and structural properties of materials, which are critical for applications in material science and engineering.
Learn more →The Importance of XRTF Testing in the Semiconductor Industry
This article mainly introduces the application of XRTF technology in the semiconductor industry.
Learn more →Principles of Simultaneous Thermal Analysis (STA) and Case Analysis
This article introduces the principles of Simultaneous Thermal Analysis (STA) and includes six detailed example analyses to illustrate its application.
Learn more →DSC vs TGA analysis
Differential Scanning Calorimetry (DSC) and Thermogravimetric Analysis (TGA) are two essential thermal analysis techniques used in material science.Both techniques are crucial for understanding the thermal properties and behavior of materials in various industrial and research applications.
Learn more →Unlocking the Power of Trace Analysis:Exploring the Versatility of ICP Spectrometry in Science and Industry
Inductively Coupled Plasma (ICP) spectrometry, utilizing either atomic emission (ICP-AES) or mass spectrometry (ICP-MS), is a highly sensitive technique that enables detailed trace element analysis across diverse sample types, making it invaluable for applications from industrial material testing to cutting-edge biomedical research.
Learn more →ICP-OES VS ICP-MS:7 Key Differences Analysis
Inductively Coupled Plasma Optical Emission Spectroscopy (ICP-OES) and Inductively Coupled Plasma Mass Spectrometry (ICP-MS) are two widely used techniques for elemental analysis. While both methods are powerful and versatile, they have distinct features that make them suitable for different applications. Here, we explore seven key differences between ICP-OES and ICP-MS
Learn more →How to Analyze Fourier Transform Infrared (FTIR) Spectra?
This article primarily introduces how to analyze Fourier Transform Infrared (FTIR) spectra.
Learn more →How to Get Started with Infrared Spectrum Analysis for Beginners?
The article primarily summarizes the essence of infrared spectrum analysis knowledge.
Learn more →Focused Ion Beam (FIB) Technology:Principles and Development History
This paper primarily introduces the basic principles and developmental history of FIB technology.
Learn more →The principle of the Focused Ion Beam Scanning Electron Microscope (FIB-SEM)
The FIB-SEM system integrates ion beam and electron microscopy functions, allowing for microscopic imaging and analysis in multiple scientific disciplines. This article provides a detailed introduction to the principles and main application areas of FIB-SEM.
Learn more →Basic Principles and Applications of STEM (Scanning Transmission Electron Microscopy)
The Scanning Transmission Electron Microscope (STEM) is a development of the Transmission Electron Microscope (TEM). In recent years, with the introduction of aberration correctors, the spatial resolution of STEM has reached sub-angstrom levels, enabling imaging and observation of single atomic columns.
Learn more →Raman or Infrared Spectroscopy----Can You Really Tell Them Apart?
This article mainly introduces the differences between Raman and infrared spectroscopy.
Learn more →Fundamental Principles and Applications of EELS
In this article, we will introduce principles and characteristics of EELS.
Learn more →FTIR Spectrum Analysis--Meaning and Application of Each Peak
This article provides a brief introduction to several common peaks in FTIR spectra.
Learn more →Current Status and Development of Plastic Modification Technology
This paper summarizes the principles, equipment and processes, raw materials, formulations, key preparation technology challenges, and applications of plastic modification.
Learn more →What are the testing methods for the mechanical properties of materials?
In this article, we will introduce and compare various commonly used sample preparation methods in transmission electron microscopy.
Learn more →Introduction to X-ray Fluorescence (XRF) Technology
This article provides a brief introduction to the principles and application scenarios of XRF.
Learn more →Micro and Nano Indentation, Oliver-Pharr Model
This article mainly introduces the differences between micro and nano indentation and the Oliver-Pharr model.
Learn more →Overview of Key Points on Electron Probe Micro-Analyzer (EPMA)
This article mainly introduces the Electron Probe Micro-Analyzer (EPMA).
Learn more →Scanning Electron Microscope (SEM) Testing Tutorial Series——Sample Requirements and Preparation——Conventional Sample Preparation
This article mainly introduces the requirements for preparing SEM standard samples.
Learn more →Time-of-flight secondary ion mass spectrometry (TOF-SIMS)
TOF-SIMS, developed since the 1970s, detects elements at ppm or ppb levels with high sensitivity and offers excellent longitudinal resolution, down to two to three atomic layers. Its small analysis areas make it essential for material composition, doping, and impurity analysis.
Learn more →Basic Principles and Applications of Auger Electron Spectroscopy (AES)
AES is applied to the analysis of the surface chemical properties and composition of samples. Its characteristic lies in the fact that it uses Auger electrons to probe the surface, even down to single atomic layers, extracting only surface chemical information. It features small analysis regions, shallow analysis depths, and non-destructive sampling, making it widely applicable in material analysis as well as research on catalysis, adsorption, corrosion, wear, and other areas.
Learn more →Principle and Application Prospects of Total Reflection X-ray Fluorescence Spectrometry (TXRF)
Total Reflection X-ray Fluorescence (TXRF) is a recent multi-element analysis technique with low detection limits, minimal sample requirements, high accuracy, simplicity, speed, and non-destructive capabilities. It is an irreplaceable and competitive method, leading in atomic spectrometry.
Learn more →Exploring the Unknown:The Spectral Power of Pulsed Lasers (LIBS)
Laser-induced breakdown spectroscopy (LIBS) is an important method in laser analysis, widely used in both laboratory and industrial fields. This technique involves using a short-pulse laser to focus on the sample surface, generating plasma. By analyzing the emission spectrum of the plasma, the composition and concentration of the sample can be determined.
Learn more →Why is Time-of-Flight Mass Spectrometry (TOFMS) considered a more ideal detector relative to Quadrupole Mass Spectrometry (QMS)?
This article primarily compares the differences between Time-of-Flight Mass Spectrometry (TOFMS) and Quadrupole Mass Spectrometry (QMS).
Learn more →VPD-ICP-MS Semiconductor Wafer Metal Contamination Analysis
The article primarily compares the differences in detection limits between VPD-ICP-MS and TXRF technologies for VPD.
Learn more →Take You Behind the Scenes of Thermal Mechanical Analysis - Thermomechanical Analyzer
This article mainly introduces the basic principles and applications of the thermomechanical analyzer.
Learn more →Super Detailed Explanation:Principles, Characteristics, Qualitative and Quantitative Analysis, Depth Profiling, and Angle-Resolved X-ray Photoelectron Spectroscopy (XPS)
This article mainly introduces the principles and characteristics of XPS, as well as its qualitative and quantitative analysis, depth profiling, and angle-resolved X-ray photoelectron spectroscopy.
Learn more →Cathodoluminescence (CL) Spectroscopy Analysis Technique
SEM-CL is a technique that combines scanning electron microscopy (SEM) with cathodoluminescence (CL) spectroscopy. This article briefly introduces the principles of SEM-CL and the requirements for samples. It also provides several related case studies.
Learn more →Dynamic Mechanical Analysis (DMA) of polymer materials, are you familiar with it?
This article primarily introduces the applications of Dynamic Mechanical Analysis (DMA).
Learn more →Have you ever made these basic errors in XPS data analysis?
The article mainly introduces the common problems encountered during XPS data analysis.
Learn more →Exploring Nanoscale Chemistry with NanoIR:A Revolutionary Nanoscale Infrared Spectroscopy System
NanoIR is an advanced nanoscale infrared spectroscopy system that combines atomic force microscopy (AFM) with infrared (IR) spectroscopy. It enables researchers to obtain chemical and structural information at the nanometer scale, making it suitable for both materials and life sciences.
Learn more →Summary of 7 major material testing methods!
At present, there are many materials analysis and testing technologies and instruments, and each has its own advantages, with its wider application range, the existing test and characterization methods are more and more unable to meet the requirements, and it is imperative to develop new characterization methods and testing technologies. This article summarizes seven common material testing methods in the laboratory:composition, spectrum, mass spectrometry, energy spectrum, morphology, phase structure, and thermogravimetry.
Learn more →The main methods and contents of battery material testing
Battery material testing is an important step in evaluating the performance of battery materials and optimizing the preparation process of battery materials. The purpose of battery material testing is to evaluate the performance of the battery, including electrochemical properties, mechanical properties, thermal properties, etc. This article will introduce the main methods of battery materials testing.
Learn more →Basic Principles of UV-Visible Diffuse Reflectance Spectroscopy
In the context of UV spectroscopy, there are two main areas:UV-Visible spectrophotometry and UV-Visible diffuse reflectance spectroscopy. This article focuses on UV-Visible diffuse reflectance spectroscopy, which falls under solid UV.
Learn more →Introduction to Raman Spectroscopy Fundamentals
This article introduces the basic knowledge of Raman spectroscopy.
Learn more →What is X-ray Photoelectron Spectroscopy (XPS)?
Understanding X-ray Photoelectron Spectroscopy (XPS) in This Article
Learn more →Completely understand X-ray photoelectron spectroscopy (XPS)
This article focuses on X-ray photoelectron spectroscopy (XPS) so that the reader can understand it
Learn more →Scanning Electron Microscope (SEM) Various Applications and Case Studies
This article mainly introduces the applications of scanning electron microscopy (SEM) in various fields along with case studies.
Learn more →Understanding Three-Dimensional Atom Probe Tomography (APT) in One Article
This article mainly introduces the 3DAPT technology, allowing readers to gain a better understanding of this technique.
Learn more →Synchrotron Radiation Fundamentals
Compared to conventional characterization techniques such as XPS, XRD, TEM, etc., synchrotron-based XAFS testing has always been a valuable and scarce resource. One important reason is the high cost of synchrotron radiation sources, which serve as large scientific facilities. Today, we will introduce some basic knowledge about synchrotron radiation.
Learn more →Comparative studies between in situ XRD and operando XRD
The main focus of this issue is to provide a brief introduction to in situ/operando XRD technology.
Learn more →Scanning Electron Microscope (SEM) Knowledge
Scanning Electron Microscopy (SEM) finds extensive applications in fields such as materials science, physics, chemistry, geology, and the microelectronics industry. It is an indispensable analytical tool in research. This article provides a detailed introduction to the principles, equipment, advantages, and disadvantages of SEM.
Learn more →The Basic Principles and Applications of XRD
XRD (X-ray Diffraction) is a rapid, accurate, and efficient non-destructive material testing technique. However, many students have only a partial understanding of the testing principles behind XRD. Here, we provide a detailed summary of XRD from its principles to applications in the simplest and most understandable language, hoping to provide some assistance to everyone.
Learn more →Research Nuggets - FAQs about TEM
The article summarizes some common questions about TEM and provides answers for everyone.
Learn more →A brief introduction to XRD test analysis
X-Ray Diffraction (XRD) is the main method for studying the physical phase and crystal structure of substances.
Learn more →Spectral Basics | Infrared Spectroscopy Guide
This article provides a detailed explanation of the basic principles of infrared (IR) spectroscopy, with a particular focus on key concepts regarding FT-IR, ATR, transmission, and reflection.
Learn more →Pole figure of macrotexture:small angle, big impact
Pole figure and macrotexture measurement with X-ray diffraction (XRD) is an essential method to acquire the distribution of crystalline orientation and anisotropic properties of polycrystal material from XRD patterns.
Learn more →Comparison and Selection of ICP-OES and ICP-MS Technologies
In the field of analytical chemistry, Inductively Coupled Plasma (ICP) technology is widely utilized for elemental analysis due to its high sensitivity, low detection limits, and wide linear dynamic range. ICP-OES (Inductively Coupled Plasma Optical Emission Spectroscopy) and ICP-MS (Inductively Coupled Plasma Mass Spectrometry) are two analytical instruments based on ICP technology, each with its own characteristics and advantages in elemental analysis.
Learn more →What is XRD test analysis
X-Ray Diffraction (XRD) is the main method for studying the physical phase and crystal structure of substances.
Learn more →What is Fourier Transform? How to understand Fourier Transform Infrared Absorption Spectroscopy (FTIR)?
Fourier Transform Infrared (FTIR) spectroscopy is a technique that detects chemical bonds in molecules by generating infrared absorption spectra of solids, liquids or gases.
Learn more →Understanding TSV Technology in One Article
In this article, we will discuss a technology called TSV that can be used for chips that communicate with each other.
Learn more →Fundamentals of Electrochemical Experiments - Part 2:Construction and Testing of Three-Electrode and Two-Electrode Systems
Basic Functions and Usage of Electrochemical Workstation.
Learn more →Introduction to Spectrum Analysis
After obtaining the diffraction spectrum on the X-ray diffractometer, it is important for beginners to understand how to interpret the spectrum and the significance of each feature in the spectrum.
Learn more →Comprehensive Compilation and Comparison of TEM Sample Preparation Methods! (Part 1)
In this article, we will introduce and compare various commonly used sample preparation methods in transmission electron microscopy.
Learn more →Comprehensive Compilation and Comparison of TEM Sample Preparation Methods! (Part 2)
In this article, we will introduce and compare various commonly used sample preparation methods in transmission electron microscopy.
Learn more →Characterization and application of XRD in two-dimensional materials
Utilize X-ray diffraction to perform high-resolution diffraction analysis and characterization of semiconductor epitaxial thin films.
Learn more →Everything you need to know about quantitative analysis in liquid chromatography is right here!
This article introduces quantitative analysis methods through noun explanations and commonly used quantitative methods, and provides examples to explain some problems that may arise during the operation process.
Learn more →Basic principles and tests of organic element analysis
This paper concludes with an introduction to the basic principles of organic element analysis, related tests, test conditions, and methods of sample preparation.
Learn more →Effect of special samples on organic element analysis tests
This article explains why organic elemental analysis test results are inaccurate.
Learn more →Exploring In Situ Liquid Ambient Transmission Electron Microscopy Techniques for the First Time
In situ electron microscopy research is in full swing and has yielded many impressive results.
Learn more →Principle of Fourier Transform Infrared Spectroscopy (FTIR) Analysis
Fourier Transform Infrared Spectroscopy (FTIR) emerged in the 1970s with advancements in spectroscopic instrumentation. Thanks to advancements in computer technology, it combines Fourier transform calculations with infrared spectroscopy techniques.
Learn more →X-ray industrial computed tomography in material analysis and quality control
Industrial CT systems have a wide range of application prospects in the field of material analysis and quality control.
Learn more →Nondestructive testing personnel must see:penetration testing of the ten misunderstandings
This paper reveals common misconceptions in the field of nondestructive testing and emphasizes the importance of proper understanding and application of penetration testing techniques.
Learn more →How good is the AFM (Atomic Force Microscope)?
Atomic force microscopy (AFM) is a powerful scientific tool that can be used to study a wide range of parameters such as nanoparticle size, surface roughness, and thickness of materials at high resolution.
Learn more →TG-DSC joint test focus
TG-DSC is a testing technique that simultaneously measures the weight change and thermal effects of materials, and is used to understand material properties and reaction behaviors.
Learn more →What types of ion sources are commonly used in liquid mass spectrometers?
Liquid Mass Spectrometers (LC/MS or LC/MS/MS) use different ionization methods including Atmospheric Pressure Ion Sources (API), Matrix Assisted Laser-Defined Ionization Sources (MALDI), and Fast Atom Bombardment Sources (FAB) for different types of sample analysis.
Learn more →Fundamentals of Electrochemical Experiments – Part 1:Basic Functions and Usage of Electrochemical Workstation
Basic Functions and Usage of Electrochemical Workstation.
Learn more →Common Elemental Analysis Methods
Elemental analysis in the analysis of foreign objects, materials testing commonly used analytical methods, in machinery, chemical industry, metallurgy, electronics, food and many other industries have a wide range of applications, this article briefly introduces some common methods of elemental analysis.
Learn more →Metal Sample Preparation:Differences between Hot and Cold Inlays
In this paper, different types of metal materials, especially high-purity tungsten, high nitrogen stainless steel, automotive steel, coated materials specimen cutting, setting, grinding, polishing and etching process of sample making skills and specific methods are summarised, in order to prepare a better metallographic specimen.
Learn more →Metallographic specimen preparation techniques and specific methods
An overview of metallographic specimen preparation (e.g. cutting, setting, grinding, polishing and etching) for different metallic samples, especially for tungsten, high nitrogen stainless steel, automotive steel and coated materials.
Learn more →What information does EBSD provide
This article introduces the microstructural information that Electron Backscatter Diffraction (EBSD) can provide.
Learn more →ICP-OES principle and pre-treatment technique
This paper introduces the working principle of ICP-OES and some pre-processing techniques.
Learn more →Recent advances and trends in EBSD technology for materials research
This paper introduces the technological development of EBSD this year and some of its applications in various fields of science and technology.
Learn more →Advanced operations of Digital Micrograph, the TEM photo processing software
Digital Micrograph is a professional software for processing images taken by transmission electron microscopy (TEM). It helps researchers to measure and analyse the microstructure of materials, such as measuring the distance between atoms and analysing the crystal structure of materials.
Learn more →Analysis of common application scenarios for FIB focused ion beams
Focused Ion Beam (FIB) technology is similar to a miniature, high-precision "sculpting tool" for materials, and is widely used in areas such as the fabrication of microscopic electronic devices.
Learn more →Differences and links between XAS and XAFS
X-ray Absorption Spectroscopy (XAS) and Synchrotron Absorption Spectroscopy (XAFS) are two analytical techniques based on the principles of X-ray spectroscopy. The purpose of this article is to describe the differences and connections between them.
Learn more →Sampling Procedures for Inspection and Sampling Plans for Lot Inspection Using ISO 2859 Analysis
The article focuses on an essential technique employed in sampling procedures—Acceptance Sampling. Acceptance Sampling is a crucial domain within standard quality control. It involves randomly extracting samples from a batch of products and, based on the assessment of these samples, making a decision to either accept or reject the entire batch.
Learn more →D-SIMS:Precision Surface Analysis for Quality Assurance
D-SIMS offers high-sensitivity, destructive surface analysis, addressing product quality issues through ultra-trace substance detection, multi-layer film analysis, and elemental content distribution mapping.
Learn more →Dynamic Secondary Ion Mass Spectrometry (D-SIMS) Alters the Limitations of Surface Analysis
D-SIMS uses high-energy ion bombardment to generate secondary ions, offering high resolution and sensitivity in analyzing sample surface chemical composition and structure.
Learn more →FIB + SEM/TEM : Energy beyond your imagination
SEM and TEM are key for characterizing materials, revealing the "structure-composition-performance" relationship, with SEM focusing on surface morphology and composition.
Learn more →Introduction to metallographic sectioning, ion milling, FIB cutting three kinds of sample making methods
This article introduces the advanced chip cross-section sampling methods, as well as the comparison of three different sampling methods, including metallographic sectioning, ion milling, and focused ion beam FIB cutting.
Learn more →The use of situ TEM in the lithium battery industry
In situ TEM is crucial for understanding complex battery reactions in energy storage, overcoming traditional method limitations with high-resolution and dynamic observation.
Learn more →Introduction for HRTEM
TEM/STEM are essential for nanostructure characterization, offering diverse imaging modes and highly sensitive details on elemental composition and electronic structure.
Learn more →Sampling procedures for inspection and sampling plans for Lot Inspection using ISO 2859
Acceptance sampling is an important method used in sampling procedures. It is also an important field of standard quality control where a random sample is taken from a lot, and upon the results of appraising the sample, the lot will be either rejected or accepted.
Learn more →Fourier-transform infrared spectroscopy (FTIR)
Almost all infrared spectrometers today are of the Fourier transform type.
Learn more →The principle of BET method
The measurement of specific surface area is of great significance in both scientific research and industrial production.
Learn more →Time of Flight Secondary Ion-Mass Spectrometry (TOF-SIMS)
Time of Flight Secondary Ion Mass Spectrometry (TOF-SIMS) is a highly sensitive surface analysis technology ...
Learn more →Difference between XRD polycrystalline and single crystal materials
X-ray diffraction (XRD) is a powerful technique used to analyze crystal structures. XRD analysis can be divided into polycrystalline diffraction and single crystal diffraction.
Learn more →Inductively Coupled Plasma - Optical Emission Spectrometer
ICP-OES can analyze 70+ elements in samples from geology, environment, chemistry, biology, medicine, food, metallurgy, and agriculture.
Learn more →Positron Annihilation Technique
Positron Annihilation Technique (PAT) provides a non-destructive means of research into the microstructure of the matter, defects, fatigue etc.
Learn more →Synchrotron X-ray absorption spectroscopy and XAFS
Synchrotron radiation is a pulsed light source with excellent properties which makes it the best choice for many cutting-edge scientific and technological researches
Learn more →Introduction to Electron Spin Resonance EPR/ESR principle
Particles with unpaired electrons can show magnetic resonance, aka, ESR or EPR. It is a powerful analytical method to measure the state of electrons in a substance.
Learn more →Surface tension measuring
What are the main methods of measuring surface tension? Du Noüy Ring, Wilhelmy Plate, and Pendant drop
Learn more →