Introduction

FIB APT sample preparation is a high quality atom probe chromatography sample preparation method based on Focused Ion Beam (FIB) technology. The method involves thinning the sample surface while bombarding it with an ion beam to remove atoms layer by layer, resulting in a nanoscale sample tip for further atom probe chromatography analysis.

FIB APT sample preparation has high-resolution imaging capabilities, allowing high-precision imaging and analysis of samples. It can be used to prepare samples of a wide range of materials including metals, semiconductors and composites for many applications including atom probe chromatography analysis.

The FIB APT Sample Preparation features a highly automated and user-friendly software interface that makes operation simple, efficient and accurate. The system is also highly stable and durable for long-term use in a variety of laboratory environments.

Representive Results

1. Rough milling and extraction of APT samples by means of a Focused Ion Beam(FIB

2. Images (a-b) are SEM of a 2.5 μA FIB unilateral and bottom free J-shaped rough milled sample

Sample Requirement

1. Sample size

The sample should be small enough to fit into the FIB chamber, with blocks preferably less than 20 mm in length and width and less than 5 mm in height.

2. Sample shape

The sample should have a flat surface that can be mounted onthe FIB processing stand. Note that the sample may need to be cut or polished to obtain a flat surface.

3. Sample material

The sample material should be compatible with FIB processing and typically includes metals, semiconductors, ceramics and biological samples. Samples should have good electrical conductivity or, if poorly conductive, should be coated with gold or carbon.

4. Sample thickness

The ideal sample thickness depends on the specific application and the type of analysis to be performed.

5. Sample quality

The sample should be of high quality with minimal defects or damage that could interfere with FIB processing.