+41 762172997
Follow Us :

Scanning Electron Microscope SEM Morphology Imaging

Instrument Type:

Hitachi Regulus8100; Hitachi S4800; Sigma 300; JSM-7800F;

Zeiss Gemini 300; Zeiss Merlin Compact; Zeiss Supra 55

Analytical Program:

Normal material -- 80 CHF/sample

Magnetic sample -- 100 CHF/sample

Order Now


A Scanning Electron Microscope (SEM) is a type of microscope that uses a focused beam of electrons to image the surface of a sample with extremely high resolution.

SEM can provide valuable information on the morphology, topography, and composition of a sample at a scale that is not achievable with other types of microscopes.

SEM can characterize nano, metallic, thin-film, semiconductive, ceramic, polymer, bio and magnetic materials.

Representive Results

1. Surface morphology imaging via secondary electron.
2. fractographic analysis via secondary electron.
3. Back scattered electron (BSE) imaging for dental drills with nano crystalline and nano particles.

Sample Requirement

Samples for Scanning Electron Microscope (SEM) imaging must meet certain requirements in order to obtain high-quality images. Here are some general requirements for preparing samples for SEM imaging:

1. Size

Samples should be small enough to fit in the SEM chamber, which typically has a maximum size limit of a few centimeters in diameter and a few centimeters in height. For ultra big sample, please consult with us.

2. Conductivity

SEM requires that the sample is electrically conductive, or has been made conductive through coating or other techniques, so that it can be grounded and imaged without charging. Materials that are not inherently conductive, such as polymers or ceramics, may require a conductive coatingg, such as gold or carbon.

3. Cleanliness

Samples should be free of debris and contaminants that could interfere with the imaging process or damage the SEM equipment. Cleaning the sample with solvents or by other methods is usually recommended.

4. Stability

Samples should be stable under the vacuum conditions inside the SEM chamber, which can cause some materials to outgas or degrade.

5. Preparation

Samples should be prepared for SEM imaging according to the specific requirements of the instrument and the application. This may involve coating the sample, cutting it to the appropriate size, or applying a conductive paste to the edges to ensure good electrical contact.

Proper preparation of SEM samples is crucial for obtaining high-quality images and accurate results. It is important to consult with the SEM manufacturer or an experienced SEM user for guidance on sample preparation techniques for your specific application.

Related Products

Ar lon Milling / Polishing

Reference price: from 200 CHF/sample

Read More
SEM Morphology Characterization

Reference price: from 80 CHF/sample

Read More
Surface Area and Porosity Analyzer BET

Reference price: from 20 CHF/sample

Read More
Ultraviolet/Visible/Near Infrared Spectroscopy

Reference price: from 50 CHF/sample

Read More