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FIB Micro Cantilever Preparation

Instrument Type:

FEI Helios NanoLab 600i; ZEISS Crossbeam 540

Analytical Program:

Normal material -- Contact us for quotation

Ultra-hard/magnetic materials -- Contact us for quotation

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FIB micro cantilever preparation is a technique used to create small, precise structures on the surface of a sample using a focused beam of ions. The process involves using a specialized instrument called a FIB machine, which uses a beam of gallium ions to etch away material from a surface..

Representive Results

1. FIB micro cantilever preparation sample

Sample Requirement

1. Sample size

The sample should be small enough to fit into the FIB chamber, with blocks preferably less than 20 mm in length and width and less than 5 mm in height.

2. Sample shape

The sample should have a flat surface that can be mounted onthe FIB processing stand. Note that the sample may need to be cut or polished to obtain a flat surface.

3. Sample material

The sample material should be compatible with FIB processing and typically includes metals, semiconductors, ceramics and biological samples. Samples should have good electrical conductivity or, if poorly conductive, should be coated with gold or carbon.

4. Sample thickness

The ideal sample thickness depends on the specific application and the type of analysis to be performed.

5. Sample quality

The sample should be of high quality with minimal defects or damage that could interfere with FIB processing or TEM imaging.

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