+41 762172997
Follow Us :

Rocking Curve (RC)

Instrument Type:

Intelligent X-ray diffractometer

Analytical Program:

X-ray rocking curve measurement -- 2 CHF/min

Contact Us


X-ray rocking curve measurement is a technique used to assess crystal quality and structural properties. It involves measuring the intensity distribution of X-rays diffracted from a crystal as the incident angle is varied. The rocking curve provides information about crystal imperfections, lattice orientation, and crystal volume. It is widely used in materials science and semiconductor research.

Representive Results

1. rocking curve patterns of SiGe film epitaxially grown on top of an Si (001) substrate

Sample Requirement

1. Flat sample surface
2. The sample length should be at least 3-5 mm along the X-ray direction.
3. Maximum sample wafer around 4 inch.
4. Maximum film thickness around 300nm.

Related Products

Ar lon Milling / Polishing

Reference price: from 200 CHF/sample

Read More
SEM Morphology Characterization

Reference price: from 80 CHF/sample

Read More
Surface Area and Porosity Analyzer BET

Reference price: from 20 CHF/sample

Read More
Ultraviolet/Visible/Near Infrared Spectroscopy

Reference price: from 50 CHF/sample

Read More