Instrument Type:
Hystron PI88; PI85, Alemnis; FemtoTools NMT04
Analytical Program:
SEM in-situ micropillar compression test -- Contact us for quotation
SEM in-situ micro tensile test -- Contact us for quotation
SEM in-situ micro-cantilever bending test -- Contact us for quotation
EBSD in-situ micropillar compression test -- Contact us for quotation
SEM in-situ nanoscratch test -- Contact us for quotation
SEM in-situ high-temperature nanomechanical test -- Contact us for quotation
Sample preparation -- Contact us for quotation
Other -- Contact us for quotation
In SEM is an instrument for characterizing thenanomechanics properties of surfaces or structures. Itpresents sub nanometer resolution under the in-situvacuum environment of SEM or FIB. It is a tool used tostudy the mechanical properties of object surfaces orstructures.
Application range:
SEM/EBSD micropillar compression test to study theplasticity of single or dual crystal
1 SEM/EBSD micro tensile test to study theplasticity and stress-strain relationship of microsample.
2 SEM/EBSD micro cantilever test to study thefracture behavior of the micro sample.
3 SEM in-situ nanoindentation test.
4 SEM in-situ nanoscratch test.
Parallel polishing of the upper and lower surfaces, witha diameter not exceeding 30mm and a height notexceeding 20mm..