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Electron Backscatter Diffraction (SEM EBSD)

Instrument Type:

EDAX TSL; Oxford Nordly max3

Analytical Program:

Mapping -- 80 CHF/map

Line scanning -- 50 CHF/line

Point analysis -- 30 CHF/ 3 point

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SEM EBSD is a technique used in materials science to study the crystallographic orientation of a sample using a scanning electron microscope. It provides information about the microstructure and mechanical properties of materials, particularly at the microscale, and is essential in materials science research and development.

SEM EBSD can be applied in:

(1) Rapid detection of orientation distribution.

(2) Orientation determination, such as single crystal, specific orientation grains, etc.

(3) Texture analysis.

(4) Geometrically necessary dislocation (GND) analysis.

(5) Recrystallization analysis.

(6) Calculation of plastic geometric factors (SF, TF).

(7) Preferred orientation analysis, such as PF, IPF, and ODF.

(8) Distribution of orientation difference.

(9) Graphical statistical analysis of grain size.

(10) Special grain boundary characterization.

Representive Results

1. Texture and misorientation analysis: EBSD Contrast image of steel.
2. Texture and misorientation analysis: EBSD Euler angle image.
3. Texture and misorientation analysis: Inverse pole figure IPF in X direction.
3. Texture and misorientation analysis: Inverse pole figure IPF in Y direction.

Sample Requirement

To perform EBSD analysis, the sample should be flat, polished, clean, thin, and have a crystalline structure. The surface should be free of debris, scratches, or visible defects that can interfere with electron diffraction.

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