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    Electron Probe Microanalysis (EPMA)

    Variant (SKU)

    Please contact us for price quotation

    Delivery time: 1 ~ 2 weeks

    Inquiry

    Electron Probe X-ray Micro Analyzer is developed on the principles of electron optics and X-ray spectroscopy, it performs microscopic analysis of solid materials through the secondary electrons, back-scattered electrons, X-rays and other signals generated by the electron beam on the micro area of the sample, revealing the compositional, morphological and structural information.

    Introduction

    Introduction

    Introduction

    Electron Probe X-ray Micro Analyzer is developed on the principles of electron optics and X-ray spectroscopy, it performs microscopic analysis of solid materials through the secondary electrons, back-scattered electrons, X-rays and other signals generated by the electron beam on the micro area of the sample, revealing the compositional, morphological and structural information.

    Instrument Type:

    • EPMA-1720;
    • JXA-8530F
    Analytical ProgramPrice (CHF/sample)
    Qualitative point composition analysis (2 sites)80
    Line composition scanning80
    2D composition mapping165
    Quantitative analysis80

    What are the main components of XRD?

    The main components of X-ray Diffraction (XRD) include an X-ray source (produces X-rays), collimators/slits (control beam shape), sample holder (positions the sample), goniometer (rotates sample and detector), detector (records diffracted X-rays), monochromator (filters unwanted wavelengths), and computer/software (analyzes diffraction patterns for material identification).

    • Quantitative chemical analysis on the surface of materials at small scales.
    • Analysis of individual mineral phases, such as igneous and metamorphic minerals.
    • Examination of small or valuable materials, including volcanic glass, meteorites, and archaeological artifacts (e.g., ceramic glazes, tools).
    • U-Th dating of minerals like monazite without isotopic ratio measurements.
    • Analysis of synthetic materials, including optical wafers, thin films, microcircuits, semiconductors, and superconducting ceramics.
    1. Caption: EPMA point composition analysis EPMA point composition quantitative analysis

    EPMA%20point%20composition%20analysis.png

    1. Caption: EPMA point composition analysisEPMA point composition quantitative analysisCaption: EPMA point composition quantitative analysisApplication 2: EPMA line composition analysis

    TEM carbon black

    1. Caption: EPMA line composition analysis

    2. Caption: EPMA 2D composition mapping analysism

    Embedded specimens

    Epoxy resin, bakelite powder, ...
    ShapeDiameterHeight
    Cylindrical18-25 mm~10 mm
    Cylindrical25 mm or 32 mm< 15 mm

    Block sample

    • Length, width and height 10 × ten × a10mm
    • cylinder with a diameter of 25or 32mm and a height of 10mm or 15mm.