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ICP-MS (Inductively Coupled Plasma Mass Spectrometry) is an ultra-sensitive technique for trace and ultra-trace elemental analysis. It combines a high-temperature plasma ion source with a mass spectrometer for precise ion detection.
Key Features:
ICP-MS is widely used in fields requiring the highest analytical sensitivity, including environmental monitoring, pharmaceuticals, food safety, nuclear science, and semiconductor manufacturing.

ICP-MS (Inductively Coupled Plasma Mass Spectrometry) is an ultra-sensitive technique for trace and ultra-trace elemental analysis. It combines a high-temperature plasma ion source with a mass spectrometer for precise ion detection. Key Features:

The ICP-MS process involves ion generation, mass separation, and ion detection:

ICP-MS testing follows these steps:
Collision/Reaction Cell (CRC) technology is often used to minimize spectral interferences.
Comparison of Analytical Techniques:
| Attribute | ICP-OES | AAS (Flame/Furnace) | ICP-MS | XRF | Wet Chemistry (Titration) |
|---|---|---|---|---|---|
| Working Principle | Optical emission from excited atoms in plasma | Light absorption by ground-state atoms | Mass detection of ions in plasma | X-ray induced fluorescence | Stoichiometric chemical reactions |
| Elements Detected | ≥70 (metals and non-metals) | Limited (~30) | ≥75 | ~40 | Limited |
| Detection Limits | sub-ppb to ppm | ppm to ppb (graphite furnace) | ppt to ppb | ppm | Variable |
| Sample Throughput | High (multi-element) | Low (single element) | High | Moderate | Low |
| Matrix Tolerance | Good (some interference correction available) | Moderate | High (collision/reaction cell options) | Variable | Low |
| Recommended Use | Routine trace analysis in complex matrices | Low-cost single-element analysis | Ultra-trace and speciation studies | Solid sample screening | Classical wet-lab environments |
2 Caption: List of elements that can be tested by ICP-OES

ICP-MS has lower detection limits (ppt vs. ppb) and can perform isotopic analysis. ICP-OES is more tolerant of high-concentration samples.
Yes, it’s widely used in nuclear, geological, and forensic studies.
They occur when ions of similar m/z overlap (e.g., ArCl⁺ with As⁺). Collision/reaction cells or software corrections are used to resolve them.
Internal standards, certified reference materials, matrix-matched calibration, and quality controls are used.
Yes, but solids must first be digested into a clear liquid form.

ICP-MS is suitable for trace analysis of metals and some non-metals in liquid samples. Its ultra-low detection limits make it ideal for high-purity and regulatory samples.

| Element | Concentration (ug/L) | Detection Limit (ug/L) |
|---|---|---|
| As | 0.034 | 0.0005 |
| Cd | 0.011 | 0.0002 |
| Pb | 0.072 | 0.0008 |
| U | 0.004 | 0.0001 |
| Hg | 0.001 | 0.0005 |
ICP-OES / ICP-MS analysis requires careful sample handling to ensure reliable results and protect instrument integrity. Please read the following sample submission guidelines before testing.
⚠️ Note: Elements such as Ru, Rh, As, Ag, U, P, S, Si may be difficult to digest or may generate weak signals. Quantitative accuracy cannot be guaranteed. However, ICP still offers relatively accurate estimates compared to other methods. Please evaluate the associated risks before proceeding with analysis.
a. Clarity and stability: Provide a transparent, clear, and stable solution without visible precipitates.
b. Organic solvents or carbon-containing liquids must not be submitted directly. Digest with nitric acid until carbon is completely removed.
c. Particulate-free: Solutions must be free of any undissolved solids or organic residues.
a. Powder samples: Provide at least 100 mg, finely ground. If possible, sieve through 200 mesh.
b. Trace amounts of solid samples should be wrapped in weighing paper and placed in a secure labeled tube.
ICP analysis is a destructive method. Material introduced into the instrument cannot be returned. Only unused portions of the sample (if available) can be recovered.
For limited sample quantities or special element testing, please consult your local project manager or contact our technical support team before submission.