Nano-SIMS is a powerful analytical tool used to analyze the chemical and isotopic composition of solid surfaces at the nanometer scale. It provides high-resolution, high-sensitivity chemical and isotopic imaging, making it invaluable for research in a wide range of scientific fields.
Key Feature
High Spatial Resolution: Can resolve features down to tens of nanometers.
High Sensitivity: Detects trace elements and isotopes at very low concentrations.
Multi-element and Isotope Analysis: Simultaneously measures several elements and isotopes.
Principle
Principle
Tiny Beam: A super-focused ion beam (down to ~50 nm wide) hits the sample.
Sputter & Ionize: It blasts atoms/molecules off the surface; some become charged (secondary ions).
Collect & Separate: Secondary ions are pulled in, accelerated, and sorted by mass/charge using magnets/electric fields.
Detect & Map: Multiple detectors catch specific ions at the same time while scanning the beam, creating elemental/isotopic maps with nanoscale resolution.
Core Point: Nano-SIMS makes highly detailed chemical maps by analyzing ions sputtered from spots just 50 nanometers across.
Test Procedure
Test Procedure
Prepare and mount the sample on a suitable holder, ensuring a clean, flat surface.
Instrument Calibration:
Theoretical limit: ~50 nm, but typically 70–100 nm due to:
Sample roughness/charging.
Primary ion beam stability (Cs⁺/O⁻ beams).
Element-dependent secondary ion yield (e.g., C⁻ resolution > metal ions).
Detection limits: ppm to ppb for most elements.
Best for: Light elements (H, C, N, O, S) and isotopes (e.g., ¹⁵N, ¹³C, ³⁴S).
Challenges: Heavy elements in dense matrices (e.g., U in zircon) may require higher beam currents.
Relative Sensitivity Factors (RSFs): Element-specific ion yield variations.
Dead time of detectors (for high counts).
Mass interferences (e.g., ¹²C¹⁴N⁻ vs. ²⁶Al⁻).
Simultaneous detection: Up to 5–7 isotopes (limited by detector array).
Key limitation: Cannot mix positive/negative ions in the same run.
Industrial Application
Application of Nano-SIMS
Biology/Medicine: Element and isotope mapping in cells and tissues.
Geoscience: Isotopic analysis of minerals and rocks.
Materials Science: Composition analysis of thin films and nanomaterials.
Environmental Science: Tracing elements in soils and microorganisms.
Forensics: Detecting trace elements in forensic samples.
Industrial Application
Dopant segregation imaging in two different YAG after sintering
Image of the silicon dopant in a YAG sample (Yttrium Aluminum Garnet) in linear color scale (left) and LOG (right). The outstanding NS sensitivity leads to a high dynamic range under each pixel. LOG color scale is often used to reveal the full information.
Left: silicon dopant map zoomed from the image above; Right: the image of a different YAG sample type showing a different segregation pattern after thermal treatment (respectively grain boundary and triplepoints).
Comparison between Nano-SIMS and Dynamic-SIMS
Feature
Nano-SIMS
Dynamic-SIMS
Spatial Resolution
~50 nm (very high)
Micrometer scale (lower)
Main Use
Surface imaging, mapping
Depth profiling, bulk analysis
Ion Beam
Focused, low current
Broad, high current
Data Output
High-res images (2D/3D maps)
Depth profiles, quantitation
Sample Requirements
To ensure accurate measurements, samples should meet these guidelines:
Flatness: Surface should be smooth and flat.
Size: Must fit standard holders (a few mm).
Conductivity: Preferably conductive or coated.
Cleanliness: Free from contaminants.
Stability: Must withstand vacuum conditions.
Feel free to contact our team for questions regarding specific materials or sample preparation requirements. If your sample exceeds standard requirements, please contact us for a customized solution.
Calibrate the Nano-SIMS instrument using standards to ensure accurate mass and spatial resolution.
Primary Ion Beam Setup:
Select and focus the primary ion beam (e.g., Cs⁺ or O⁻) onto the area of interest.
Sputtering and Data Collection:
Bombard the sample with the primary ion beam to sputter secondary ions, which are then collected and analyzed by the mass spectrometer.
Imaging:
Scan the primary ion beam across the sample to generate high-resolution chemical or isotopic maps.
Data Analysis:
Process and interpret the acquired data to obtain quantitative and spatial information about the sample’s composition.
Nano-SIMS analyzes a material's elemental and isotopic composition at the nanometer scale. A focused ion beam bombards the sample, emitting secondary ions that are analyzed by a mass spectrometer. This provides high spatial resolution (down to 50 nm), high sensitivity, and isotopic analysis capabilities. Nano-SIMS is used across diverse fields like materials science, geology, and biology to study nanoscale composition and structure.
